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si 3 n 4 membranes  (Silson Ltd)

 
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    Silson Ltd si 3 n 4 membranes
    Si 3 N 4 Membranes, supplied by Silson Ltd, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/si 3 n 4 membranes/product/Silson Ltd
    Average 86 stars, based on 1 article reviews
    si 3 n 4 membranes - by Bioz Stars, 2026-06
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    Size-selected Pt n cluster generation, deposition and transport on silicon nitride and silicon oxide supports. (a) Scanning the mass-to-charge ratio via the quadrupole mass filter gives a mass spectrum with an intense peak for Pt atoms and separate peaks for Pt n ( n = 2, 3, 4, … 31) clusters. (b and c) Pt 20 clusters deposited onto the 8 nm thin Si 3 N 4 membrane of a TEM grid imaged via HAADF-STEM (b) before and (c) after transport from Munich to Berkeley in air, XPS measurements in oxidizing and reducing atmospheres and transport back to Munich. (d) Pt 4f region of Pt n /SiO 2 /n-Si(100) samples with n = 8, 12, 13, 14, 20 and 40 atom clusters. The black vertical line is a guide to the eye, illustrating the binding energy size dependence. (e) C 1s region of a SiO 2 /n-Si sample taken at 490 eV during sample cleaning in 0.7 mbar O 2 at 393 K, at the beginning of the treatment (black) and after 20 min (red). (f) Representative Si 2p spectrum and fit.
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    Size-selected Pt n cluster generation, deposition and transport on silicon nitride and silicon oxide supports. (a) Scanning the mass-to-charge ratio via the quadrupole mass filter gives a mass spectrum with an intense peak for Pt atoms and separate peaks for Pt n ( n = 2, 3, 4, … 31) clusters. (b and c) Pt 20 clusters deposited onto the 8 nm thin Si 3 N 4 membrane of a TEM grid imaged via HAADF-STEM (b) before and (c) after transport from Munich to Berkeley in air, XPS measurements in oxidizing and reducing atmospheres and transport back to Munich. (d) Pt 4f region of Pt n /SiO 2 /n-Si(100) samples with n = 8, 12, 13, 14, 20 and 40 atom clusters. The black vertical line is a guide to the eye, illustrating the binding energy size dependence. (e) C 1s region of a SiO 2 /n-Si sample taken at 490 eV during sample cleaning in 0.7 mbar O 2 at 393 K, at the beginning of the treatment (black) and after 20 min (red). (f) Representative Si 2p spectrum and fit.
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    https://www.bioz.com/result/si 3 n 4 membrane/product/Silson Ltd
    Average 90 stars, based on 1 article reviews
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    Image Search Results


    Size-selected Pt n cluster generation, deposition and transport on silicon nitride and silicon oxide supports. (a) Scanning the mass-to-charge ratio via the quadrupole mass filter gives a mass spectrum with an intense peak for Pt atoms and separate peaks for Pt n ( n = 2, 3, 4, … 31) clusters. (b and c) Pt 20 clusters deposited onto the 8 nm thin Si 3 N 4 membrane of a TEM grid imaged via HAADF-STEM (b) before and (c) after transport from Munich to Berkeley in air, XPS measurements in oxidizing and reducing atmospheres and transport back to Munich. (d) Pt 4f region of Pt n /SiO 2 /n-Si(100) samples with n = 8, 12, 13, 14, 20 and 40 atom clusters. The black vertical line is a guide to the eye, illustrating the binding energy size dependence. (e) C 1s region of a SiO 2 /n-Si sample taken at 490 eV during sample cleaning in 0.7 mbar O 2 at 393 K, at the beginning of the treatment (black) and after 20 min (red). (f) Representative Si 2p spectrum and fit.

    Journal: Faraday Discussions

    Article Title: Evolution of size-selected Pt cluster catalysts on prototypical oxide supports

    doi: 10.1039/d6fd00002a

    Figure Lengend Snippet: Size-selected Pt n cluster generation, deposition and transport on silicon nitride and silicon oxide supports. (a) Scanning the mass-to-charge ratio via the quadrupole mass filter gives a mass spectrum with an intense peak for Pt atoms and separate peaks for Pt n ( n = 2, 3, 4, … 31) clusters. (b and c) Pt 20 clusters deposited onto the 8 nm thin Si 3 N 4 membrane of a TEM grid imaged via HAADF-STEM (b) before and (c) after transport from Munich to Berkeley in air, XPS measurements in oxidizing and reducing atmospheres and transport back to Munich. (d) Pt 4f region of Pt n /SiO 2 /n-Si(100) samples with n = 8, 12, 13, 14, 20 and 40 atom clusters. The black vertical line is a guide to the eye, illustrating the binding energy size dependence. (e) C 1s region of a SiO 2 /n-Si sample taken at 490 eV during sample cleaning in 0.7 mbar O 2 at 393 K, at the beginning of the treatment (black) and after 20 min (red). (f) Representative Si 2p spectrum and fit.

    Article Snippet: For checks of Pt n cluster size via scanning transmission electron microscopy (STEM), clusters were deposited onto TEM grids with 8 nm thin suspended Si 3 N 4 membranes (TedPella, layout see SI, Fig. S2), using a hot filament in the vicinity for charge compensation on the sample.

    Techniques: Membrane, Binding Assay